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Semiconductors
Any solid material with electrical conductivity due to electron flow (as opposed to ionic conductivity) of a magnitude between that of a conductor and that of an insulator.
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Semiconductors > Test equipment
certificate of conformance (COC)
Semiconductors; Test equipment
A contractor's written statement, when authorized by contract, certifying that supplies or services are in conformance with contract requirements.
chip-On-chip (COC)
Semiconductors; Test equipment
A process in which unpackaged integrated circuits are mounted on top of each other. Each die is very thin and it is possible to have over a hundred die forming a 3D cube
chip-On-flex (COF)
Semiconductors; Test equipment
Similar to chip-on-board (COC), except that the unpackaged integrated circuits are attached to a flexible printed circuit.
cost of poor quality (COPQ)
Semiconductors; Test equipment
The total cost of repair, rework, scrap, service calls, warranty claims and write-offs from obsolete finished goods as a percentage of annual sales. Experts have estimated that ...
certificate of quality compliance (COQC)
Semiconductors; Test equipment
A contractor's certification that provides specific detailed information and objective evidence that material offered for acceptance meets all contract and specification ...
commercial off-the-shelf (COTS)
Semiconductors; Test equipment
Equipment readily available commercially and one that was not developed for a particular custom application (such as military).
complex programmable logic device (CPLD)
Semiconductors; Test equipment
A programmable IC which is more complex than the original Programmable Logic Devices such as AMD's (originally MMI's) PALs but somewhat less complex than Field Programmable Logic ...
Sub-categories
- Assembly equipment (1)
- Components, parts & accessories (177)
- Digital Signal Processors (DSP) (7506)
- Diodes (20)
- Flat panel display (0)
- Inspection & measurement equipment (1)
- Integrated circuit (515)
- Process equipment (48)
- Semiconductor quality (3058)
- Silicon wafer (499)
- Sub-systems (1)
- Test equipment (3445)
- Transistor (94)
- Vacuum technology (1)